Please use this identifier to cite or link to this item:
https://libr.msu.by/handle/123456789/10674Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Timoshchenko, E. V. | - |
| dc.contributor.author | Yurevich, V. A. | - |
| dc.contributor.author | Yurevich, Yu. V. | - |
| dc.date.accessioned | 2020-02-04T08:38:14Z | - |
| dc.date.available | 2020-02-04T08:38:14Z | - |
| dc.date.issued | 2013 | - |
| dc.identifier.citation | Timoshchenko, E. V. Resonance reflection of light by a thin layer of a dense nonlinear medium / E. V. Timoshchenko, V. A. Yurevich, Y. V. Yurevich // Technical Physics. The Russian Journal of Applied Physics. – 2013. – Vol. 58. – № 2. – Р. 251–254. | ru_RU |
| dc.identifier.other | DOI: 10.1134/S 1063784213020254 | - |
| dc.identifier.uri | http://libr.msu.by/handle/123456789/10674 | - |
| dc.description.abstract | The possibility of hysteretic behavior of resonant reflection spectral curves is determined analytically for the conditions of the dipole-dipole interaction and spectral shift of the field. The phase shift of the acting field is associated with the variation of the energy state of a dense resonant medium forming a thin boundary layer. The problem is considered for the parameters of quantum-size structures based on semiconductors used in optics. | ru_RU |
| dc.language.iso | en | ru_RU |
| dc.publisher | Pleiades Publishing, Ltd. | ru_RU |
| dc.subject | optics | ru_RU |
| dc.title | Resonance reflection of light by a thin layer of a dense nonlinear medium | ru_RU |
| dc.type | Article | ru_RU |
| Appears in Collections: | Научные публикации | |
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