Please use this identifier to cite or link to this item: https://libr.msu.by/handle/123456789/10674
Title: Resonance reflection of light by a thin layer of a dense nonlinear medium
Authors: Timoshchenko, E. V.
Yurevich, V. A.
Yurevich, Yu. V.
Keywords: optics
Issue Date: 2013
Publisher: Pleiades Publishing, Ltd.
Citation: Timoshchenko, E. V. Resonance reflection of light by a thin layer of a dense nonlinear medium / E. V. Timoshchenko, V. A. Yurevich, Y. V. Yurevich // Technical Physics. The Russian Journal of Applied Physics. – 2013. – Vol. 58. – № 2. – Р. 251–254.
Abstract: The possibility of hysteretic behavior of resonant reflection spectral curves is determined analytically for the conditions of the dipole-dipole interaction and spectral shift of the field. The phase shift of the acting field is associated with the variation of the energy state of a dense resonant medium forming a thin boundary layer. The problem is considered for the parameters of quantum-size structures based on semiconductors used in optics.
URI: http://libr.msu.by/handle/123456789/10674
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