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Title: | Resonance reflection of light by a thin layer of a dense nonlinear medium |
Authors: | Timoshchenko, E. V. Yurevich, V. A. Yurevich, Yu. V. |
Keywords: | optics |
Issue Date: | 2013 |
Publisher: | Pleiades Publishing, Ltd. |
Citation: | Timoshchenko, E. V. Resonance reflection of light by a thin layer of a dense nonlinear medium / E. V. Timoshchenko, V. A. Yurevich, Y. V. Yurevich // Technical Physics. The Russian Journal of Applied Physics. – 2013. – Vol. 58. – № 2. – Р. 251–254. |
Abstract: | The possibility of hysteretic behavior of resonant reflection spectral curves is determined analytically for the conditions of the dipole-dipole interaction and spectral shift of the field. The phase shift of the acting field is associated with the variation of the energy state of a dense resonant medium forming a thin boundary layer. The problem is considered for the parameters of quantum-size structures based on semiconductors used in optics. |
URI: | http://libr.msu.by/handle/123456789/10674 |
Appears in Collections: | Научные публикации |
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