Please use this identifier to cite or link to this item: https://libr.msu.by/handle/123456789/10708
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dc.contributor.authorYurevich, V. A.-
dc.contributor.authorYurevich, Yu. V.-
dc.contributor.authorTimoschenko, E. V.-
dc.date.accessioned2020-02-13T13:11:17Z-
dc.date.available2020-02-13T13:11:17Z-
dc.date.issued2016-
dc.identifier.citationYurevich, V. A. Resonant Reflection by Active Thin Layer / V. A. Yurevich, Yu. V. Yurevich, E. V. Timoschenko // Журнал прикладной спектроскопии. – 2016. – Т. 83. – № 6-16. – С. 307–308.ru_RU
dc.identifier.urihttp://libr.msu.by/handle/123456789/10708-
dc.description.abstractIn the ultra-thin layer approximation in semi-classical model of interaction the computation of resonant reflection of an ultrashort pulse by dense resonant film is carried out. We used the model parameters of semiconductor quantum-size structures.ru_RU
dc.language.isoenru_RU
dc.publisherИнститут физики им. Б. И. Степанова НАН Беларусиru_RU
dc.subjectlight reflectionru_RU
dc.subjectthin filmru_RU
dc.subjectresonant reflectionru_RU
dc.titleResonant Reflection by Active Thin Layer.ru_RU
dc.typeArticleru_RU
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