Please use this identifier to cite or link to this item:
https://libr.msu.by/handle/123456789/10708| Title: | Resonant Reflection by Active Thin Layer. |
| Authors: | Yurevich, V. A. Yurevich, Yu. V. Timoschenko, E. V. |
| Keywords: | light reflection thin film resonant reflection |
| Issue Date: | 2016 |
| Publisher: | Институт физики им. Б. И. Степанова НАН Беларуси |
| Citation: | Yurevich, V. A. Resonant Reflection by Active Thin Layer / V. A. Yurevich, Yu. V. Yurevich, E. V. Timoschenko // Журнал прикладной спектроскопии. – 2016. – Т. 83. – № 6-16. – С. 307–308. |
| Abstract: | In the ultra-thin layer approximation in semi-classical model of interaction the computation of resonant reflection of an ultrashort pulse by dense resonant film is carried out. We used the model parameters of semiconductor quantum-size structures. |
| URI: | http://libr.msu.by/handle/123456789/10708 |
| Appears in Collections: | Научные публикации |
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