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Title: Resonant Reflection by Active Thin Layer.
Authors: Yurevich, V. A.
Yurevich, Yu. V.
Timoschenko, E. V.
Keywords: light reflection
thin film
resonant reflection
Issue Date: 2016
Publisher: Институт физики им. Б. И. Степанова НАН Беларуси
Citation: Yurevich, V. A. Resonant Reflection by Active Thin Layer / V. A. Yurevich, Yu. V. Yurevich, E. V. Timoschenko // Журнал прикладной спектроскопии. – 2016. – Т. 83. – № 6-16. – С. 307–308.
Abstract: In the ultra-thin layer approximation in semi-classical model of interaction the computation of resonant reflection of an ultrashort pulse by dense resonant film is carried out. We used the model parameters of semiconductor quantum-size structures.
Appears in Collections:Научные публикации

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